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2744. Identifying Root Causes and Effects of RFID System Failures with Integration of AHP, DEMATEL, TOPSIS, DEA and FMCEA

Invited abstract in session MB-47: MCDA applications in Engineering and Management 2, stream Multiple Criteria Decision Analysis.

Monday, 10:30-12:00
Room: 50 (building: 324)

Authors (first author is the speaker)

1. Sahand Daneshvar
Industrial Engineering, Eastern Mediterranean University
2. Khaoula Chnina
Industrial Engineering, Eastern Mediterranean University

Abstract

FMCEA (Failure Modes Causes and Effect Analysis) has long been utilized as an effective risk management approach across various industries for examining and assessing the failure modes of diverse products and processes. Nonetheless, this method exhibits several shortcomings associated with traditional RPN (Risk Priority Number) calculations, such as duplicate identification, gaps, and equal weighting of experts, as well as the lack of consideration for various factors like risk parameter weights, interrelationships, cost, and time and efficiency notions in risk assessment.

To overcome these limitations, a five-stage methodology integrating Analytic Hierarchy Process (AHP), Technique for Order of Preference by Similarity to Ideal Solution (TOPSIS), Decision Making Trial and Evaluation Laboratory (DEMATEL), and Data Envelopment Analysis (DEA) with FMCEA is proposed. First, AHP assigns weights to experts, while FMCEA assesses failure causes considering occurrence, detection, severity, cost, and time. DEMATEL weights risk factors and explores their interrelationships. TOPSIS calculates RPNs. DEA measures efficiency and establishes interrelation matrices. DEMATEL ranks sub-failure modes based on their interrelationships. Finally, an aggregation procedure combines related sub-failure modes. The RFID system is used as an example to illustrate the methodology to show the advantages of the proposed approach.

Keywords

Status: accepted

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