2432. Scheduling Parallel Stress Test Machines in Semiconductor Reliability Laboratories: Exact and Heuristic Approaches
Invited abstract in session TA-12: Scheduling Approaches for Complex Manufacturing Systems, stream Scheduling and Project Management.
Tuesday, 8:30-10:00Room: Clarendon SR 1.02
Authors (first author is the speaker)
| 1. | Jessica Hautz
|
| 2. | Lars Moench
|
| FernUniversität in Hagen |
Abstract
A parallel machine scheduling problem motivated by stress test machines in semiconductor reliability laboratories is considered. The jobs have unequal sizes and ready times, and belong to incompatible job families. Jobs of the same family can be processed simultaneously on a machine if the sum of their sizes does not exceed the machine’s capacity. In contrast to conventional p-batching machines, the machines can be interrupted to start new jobs and have to be interrupted to unload completed ones, requiring conditioning times to restore the necessary stress conditions. The machines are unavailable during conditioning periods, and jobs that were preempted are resumable after conditioning. The performance measures are the makespan and the total (weighted) completion time. Mixed-integer linear programming and constraint programming models are established. A constructive heuristic and metaheuristics are designed. Computational experiments on randomly generated instances demonstrate good performance in terms of solution quality and time.
Keywords
- Programming, Mixed-Integer
- Combinatorial Optimization
- Industrial Optimization
Status: accepted
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